BABA, NOOR HASIMAH BINTI (2007) Microwave Nondestructive Method for Characterization of Semiconductor Wafers at Frequencies 18 to 26.5 GHz. In: UNSPECIFIED.
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| Item Type: | Conference or Workshop Item (UNSPECIFIED) |
|---|---|
| PRISMA ID: | 2202 |
| URI: | http://oarr.uitm.edu.my/id/eprint/17193 |
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