Hot Carrier Reliability Characterization of Sub-micron MOSFET

ZOOLFAKAR, AHMAD SABIRIN BIN (2005) Hot Carrier Reliability Characterization of Sub-micron MOSFET. In: UNSPECIFIED.

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Item Type:	Conference or Workshop Item (UNSPECIFIED)
PRISMA ID:	3191
URI:	http://oarr.uitm.edu.my/id/eprint/17558

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