Measurement of dielectric constant and conductivity of silicon wafers at microwave frequencies using a free space method

BABA, NOOR HASIMAH BINTI (2004) Measurement of dielectric constant and conductivity of silicon wafers at microwave frequencies using a free space method. In: UNSPECIFIED.

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Item Type:	Conference or Workshop Item (UNSPECIFIED)
PRISMA ID:	4522
URI:	http://oarr.uitm.edu.my/id/eprint/18017

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