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Study the effect of Drain Induced Barrier Lowering (DIBL) on P-Type MOSFET Device.

HASHIM, HASHIMAH BINTI (2008) Study the effect of Drain Induced Barrier Lowering (DIBL) on P-Type MOSFET Device. In: UNSPECIFIED.

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Item Type: Conference or Workshop Item (UNSPECIFIED)
PRISMA ID: 7934
URI: http://oarr.uitm.edu.my/id/eprint/19540

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