Simulation and Characterization of 0.13um CMOS using Silicon-On-Insulator (SOI) Technology

RADZALI, ROSFARIZA BINTI (2008) Simulation and Characterization of 0.13um CMOS using Silicon-On-Insulator (SOI) Technology. In: UNSPECIFIED.

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Item Type:	Conference or Workshop Item (UNSPECIFIED)
PRISMA ID:	11172
URI:	http://oarr.uitm.edu.my/id/eprint/20838

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