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Effect of Y2O3 content in a YSZ seed layer on crystallization of a low-temperature deposited Si film

HERMAN, SUKREEN HANA BINTI (2008) Effect of Y2O3 content in a YSZ seed layer on crystallization of a low-temperature deposited Si film. In: UNSPECIFIED.

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Item Type: Conference or Workshop Item (UNSPECIFIED)
PRISMA ID: 23409
URI: http://oarr.uitm.edu.my/id/eprint/25171

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