Failure Mechanism of Silicon Germanium (SiGe) Technology on 90nm PMOS

ZOOLFAKAR, AHMAD SABIRIN BIN (2010) Failure Mechanism of Silicon Germanium (SiGe) Technology on 90nm PMOS. In: UNSPECIFIED.

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Item Type:	Conference or Workshop Item (UNSPECIFIED)
PRISMA ID:	25413
URI:	http://oarr.uitm.edu.my/id/eprint/25995

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