Measurement of dielectric constant and conductivity of silicon wafers at microwave frequencies using a free space method

BABA, NOOR HASIMAH BINTI (2006) Measurement of dielectric constant and conductivity of silicon wafers at microwave frequencies using a free space method.

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Item Type:	Article
PRISMA ID:	12523
URI:	http://oarr.uitm.edu.my/id/eprint/3894

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