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Electrical Performance of 0.5 micron MOSFET on Bond-and-Etch-Back Silicon-On-Insulator (BESOI) Substrate

ABDULLAH, WAN FAZLIDA HANIM BT (2002) Electrical Performance of 0.5 micron MOSFET on Bond-and-Etch-Back Silicon-On-Insulator (BESOI) Substrate. In: UNSPECIFIED.

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Item Type: Conference or Workshop Item (UNSPECIFIED)
PRISMA ID: 23306
URI: http://oarr.uitm.edu.my/id/eprint/25125

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