ID defect minimization in glass substrate industry
This study is mainly about the ID defect reduction project in glass substrate manufacturing industry. By using quality tools, lean manufacturing approach, and total quality management, defect can be reduce by controlling on 4 variables: data variance in SPC, measurement tools accuracy, machine stabi...
| 第一著者: | |
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| フォーマット: | 学位論文 |
| 言語: | 英語 英語 |
| 出版事項: |
2013
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| 主題: | |
| オンライン･アクセス: | http://eprints.utem.edu.my/id/eprint/14964/1/ID%20defect%20minimization%20in%20glass%20substrate%20industry.pdf http://eprints.utem.edu.my/id/eprint/14964/2/ID%20defect%20minimization%20in%20glass%20substrate%20industry.pdf |