Improving OEE data quality by automated data collection through identifying productivity potentials

Most semiconductor organizations take after the SEMI standard rules to gauge equipment availability and utilization by means of Overall Equipment Effectiveness (OEE). Be that as it may, a few issues should be vanquished to get improve data accuracy of OEE. For instance, the time interims of OEE loss...

وصف كامل

التفاصيل البيبلوغرافية
المؤلف الرئيسي: Karuppiah, K.Vasanthan
التنسيق: أطروحة
اللغة:الإنجليزية
الإنجليزية
منشور في: 2017
الموضوعات:
T Technology (General)
TS Manufactures
الوصول للمادة أونلاين:http://eprints.utem.edu.my/id/eprint/20972/1/Improving%20OEE%20data%20quality%20by%20automated%20data%20collection%20through%20identifying%20productivity%20potentials.pdf
http://eprints.utem.edu.my/id/eprint/20972/2/Improving%20OEE%20data%20quality%20by%20automated%20data%20collection%20through%20identifying%20productivity%20potentials.pdf

الانترنت

http://eprints.utem.edu.my/id/eprint/20972/1/Improving%20OEE%20data%20quality%20by%20automated%20data%20collection%20through%20identifying%20productivity%20potentials.pdf
http://eprints.utem.edu.my/id/eprint/20972/2/Improving%20OEE%20data%20quality%20by%20automated%20data%20collection%20through%20identifying%20productivity%20potentials.pdf

مواد مشابهة