Improving overall equipment effectiveness of tesec test handler on unloader jamming reduction at LPL testing area using DMAIC approach

Infineon Technologies Melaka today makes great financial investments in testing their processes and systems to ensure that they will meet customer expectations. The corporations go through all the precise steps to test as thoroughly as possible at a time in many cases at the end consequences are les...

詳細記述

書誌詳細

第一著者:	Maria Amirtha Raj, Michel Raj
フォーマット:	学位論文
言語:	英語 英語
出版事項:	2017
主題:	T Technology (General) TS Manufactures
オンライン･アクセス:	http://eprints.utem.edu.my/id/eprint/22398/1/Improving%20Overall%20Equipment%20Effectiveness%20Of%20Tesec%20Test%20Handler%20On%20Unloader%20Jamming%20Reduction%20At%20LPL%20Testing%20Area%20Using%20DMAIC%20Approach%20-%20Michel%20Raj%20Maria%20Amirtha%20Raj%20-%2024%20Pages.pdf http://eprints.utem.edu.my/id/eprint/22398/2/Improving%20overall%20equipment%20effectiveness%20of%20tesec%20test%20handler%20on%20unloader%20jamming%20reduction%20at%20LPL%20testing%20area%20using%20DMAIC%20approach.pdf