Improvement of vision inspection during tip to tip measurement through parameter optimization

During the running of mass production, yield loss is unavoidable. This can be due to various factors which include but not limited due to the incoming material quality, the machine itself or unnecessary rejection of a product. Unnecessary rejection of a good product often occurs during the vision in...

詳細記述

書誌詳細
第一著者: Rahman, Muhamad Hakim
フォーマット: 学位論文
言語:英語
英語
出版事項: 2018
主題:
オンライン・アクセス:http://eprints.utem.edu.my/id/eprint/23963/1/Improvement%20Of%20Vision%20Inspection%20During%20Tip%20To%20Tip%20Measurement%20Through%20Parameter%20Optimization.pdf
http://eprints.utem.edu.my/id/eprint/23963/2/Improvement%20of%20vision%20inspection%20during%20tip%20to%20tip%20measurement%20through%20parameter%20optimization.pdf

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