APA (7th ed.) Citation

Tan, C. C. R. (2021). Smart control sampling system for metrology tool in semiconductor production line.

Chicago Style (17th ed.) Citation

Tan, Cheerrein Cher Ring. Smart Control Sampling System for Metrology Tool in Semiconductor Production Line. 2021.

MLA (9th ed.) Citation

Tan, Cheerrein Cher Ring. Smart Control Sampling System for Metrology Tool in Semiconductor Production Line. 2021.

Warning: These citations may not always be 100% accurate.