Development of automated neighborhood pattern sensitive faults syndrome generator for static random access memory
Testing is one of the main key in advanced semiconductor memory technologies. In the past, memory testing only focuses on fault detection. With the increasing complexity of memory devices, fault diagnosis is becoming very important to locate and identify type of fault. One of the memory faults is N...
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| フォーマット: | 学位論文 |
| 言語: | 英語 |
| 出版事項: |
2011
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| オンライン･アクセス: | http://psasir.upm.edu.my/id/eprint/42865/1/FK%202011%20114R.pdf |