Ahmed, R. A. (2013). Fault tolerance of L1 data cache memory induced by intrinsic parameters fluctuation in sub 10nm UTB-SOI MOSFETs.
Style de citation Chicago (17e éd.)Ahmed, Rabah Abood. Fault Tolerance of L1 Data Cache Memory Induced by Intrinsic Parameters Fluctuation in Sub 10nm UTB-SOI MOSFETs. 2013.
Style de citation MLA (9e éd.)Ahmed, Rabah Abood. Fault Tolerance of L1 Data Cache Memory Induced by Intrinsic Parameters Fluctuation in Sub 10nm UTB-SOI MOSFETs. 2013.
Attention : ces citations peuvent ne pas être correctes à 100%.