Ahmed, R. A. (2013). Fault tolerance of L1 data cache memory induced by intrinsic parameters fluctuation in sub 10nm UTB-SOI MOSFETs.
Chicago Style (17th ed.) CitationAhmed, Rabah Abood. Fault Tolerance of L1 Data Cache Memory Induced by Intrinsic Parameters Fluctuation in Sub 10nm UTB-SOI MOSFETs. 2013.
MLA (9th ed.) CitationAhmed, Rabah Abood. Fault Tolerance of L1 Data Cache Memory Induced by Intrinsic Parameters Fluctuation in Sub 10nm UTB-SOI MOSFETs. 2013.
Warning: These citations may not always be 100% accurate.