APA(7版)引用形式

Ahmed, R. A. (2013). Fault tolerance of L1 data cache memory induced by intrinsic parameters fluctuation in sub 10nm UTB-SOI MOSFETs.

Chicagoスタイル(17版)引用形式

Ahmed, Rabah Abood. Fault Tolerance of L1 Data Cache Memory Induced by Intrinsic Parameters Fluctuation in Sub 10nm UTB-SOI MOSFETs. 2013.

MLA(9版)引用形式

Ahmed, Rabah Abood. Fault Tolerance of L1 Data Cache Memory Induced by Intrinsic Parameters Fluctuation in Sub 10nm UTB-SOI MOSFETs. 2013.

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