Ahmed, R. A. (2013). Fault tolerance of L1 data cache memory induced by intrinsic parameters fluctuation in sub 10nm UTB-SOI MOSFETs.
芝加哥风格引文Ahmed, Rabah Abood. Fault Tolerance of L1 Data Cache Memory Induced by Intrinsic Parameters Fluctuation in Sub 10nm UTB-SOI MOSFETs. 2013.
MLA引文Ahmed, Rabah Abood. Fault Tolerance of L1 Data Cache Memory Induced by Intrinsic Parameters Fluctuation in Sub 10nm UTB-SOI MOSFETs. 2013.
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