Software Modification in a Fault Analysis Tool for Critical Path Debugging

Microprocessor units caught with speed failure are becoming more and more eminent as the fabrication process shrinks according to Moore’s Law. Failure Analysis (FA) engineers confront the problem using Critical Path Debug method utilizing special IC (Integrated Circuit) test system capable of tes...

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Détails bibliographiques
Auteur principal:	Han, Chung Dean
Format:	Thèse
Langue:	anglais anglais
Publié:	2009
Accès en ligne:	http://psasir.upm.edu.my/id/eprint/7360/1/FK_2009_50a.pdf

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