Software Modification in a Fault Analysis Tool for Critical Path Debugging

Microprocessor units caught with speed failure are becoming more and more eminent as the fabrication process shrinks according to Moore’s Law. Failure Analysis (FA) engineers confront the problem using Critical Path Debug method utilizing special IC (Integrated Circuit) test system capable of tes...

पूर्ण विवरण

ग्रंथसूची विवरण
मुख्य लेखक:	Han, Chung Dean
स्वरूप:	थीसिस
भाषा:	अंग्रेज़ी अंग्रेज़ी
प्रकाशित:	2009
ऑनलाइन पहुंच:	http://psasir.upm.edu.my/id/eprint/7360/1/FK_2009_50a.pdf

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