Software Modification in a Fault Analysis Tool for Critical Path Debugging

Microprocessor units caught with speed failure are becoming more and more eminent as the fabrication process shrinks according to Moore’s Law. Failure Analysis (FA) engineers confront the problem using Critical Path Debug method utilizing special IC (Integrated Circuit) test system capable of tes...

書誌詳細
第一著者:	Han, Chung Dean
フォーマット:	学位論文
言語:	英語英語
出版事項:	2009
オンライン･アクセス:	http://psasir.upm.edu.my/id/eprint/7360/1/FK_2009_50a.pdf

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