Multiple and solid data background scheme for testing static single cell faults on SRAM memories
Memory testing is a method that requires an algorithm capable of detecting faulty memory as comprehensively as possible to facilitate the efficient manufacture of fault free memory products. Therefore, the purpose of this thesis is to introduce a Data Background (DB) scheme to generate an optimal...
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| フォーマット: | 学位論文 |
| 言語: | 英語 |
| 出版事項: |
2013
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| 主題: | |
| オンライン･アクセス: | http://psasir.upm.edu.my/id/eprint/84183/1/FK%202013%20142%20-%20ir.pdf |