Fsm-Based Enhanced March C- Algorithm For Memory Built-In Self-Test

Algorithms plays an important role in the Memory Built-In Self-Test as its structure will define the fault coverage of the system. Thus, the improvement of the algorithms will allow more fault types being identified in single test. For MARCH C- algorithm, it was a quite balance algorithm as it has t...

書誌詳細
第一著者:	CH’NG , MING ZONG
フォーマット:	学位論文
言語:	英語
出版事項:	2017
主題:	TK1-9971 Electrical engineering. Electronics. Nuclear engineering
オンライン･アクセス:	http://eprints.usm.my/39370/
Abstract	Abstract here

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