Fault Isolation with ‘X’ Filter for Bogus Signals and Intensive Scan Cell Sequence Validation
There are some concerns in silicon data collection by using the Design-For-Test (DFT). Bogus signal which carries ‘x’ value in simulation, results from the complex logic synthesis and power-up floating state can often mislead the fault isolation process with invalid failing condition. Besides, scan...
| المؤلف الرئيسي: | |
|---|---|
| التنسيق: | أطروحة |
| اللغة: | الإنجليزية |
| منشور في: |
2017
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| الموضوعات: | |
| الوصول للمادة أونلاين: | http://eprints.usm.my/39412/ |
| Abstract | Abstract here |