Exploring High Resolution Test Pattern To Improve The Cache Failure Analysis

Typically, only pass/fail basis test algorithm is being used to test the cache array in silicon devices. But the pass/fail basis test algorithm is insufficient to identify the failing characteristic of the cache array when it comes to the failure analysis (FA) and debug stage to find out the root ca...

وصف كامل

التفاصيل البيبلوغرافية
المؤلف الرئيسي:	Ong, Chein Ee
التنسيق:	أطروحة
اللغة:	الإنجليزية
منشور في:	2017
الموضوعات:	TK1-9971 Electrical engineering. Electronics. Nuclear engineering
الوصول للمادة أونلاين:	http://eprints.usm.my/39576/
Abstract	Abstract here

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