Scan Test Coverage Improvement Via Automatic Test Pattern Generation (Atpg) Tool Configuration

The scan test coverage improvement by using automatic test pattern generation (ATPG) tool configuration was investigated. Improving the test coverage is essential in detecting manufacturing defects in semiconductor industry so that high quality products can be supplied to consumers. The ATPG tool us...

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Bibliographic Details
Main Author:	Salehuddin, Muhammad Redzwan
Format:	Thesis
Language:	English
Published:	2017
Subjects:	TK1-9971 Electrical engineering. Electronics. Nuclear engineering
Online Access:	http://eprints.usm.my/39652/
Abstract	Abstract here

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