Development Of Laser Assisted Device Alteration (Lada) Technique For Failure Region Identification In Integrated Circuit
The purpose of this research is to create a solution for some of the obstacles faced during Integrated Circuit (IC) Failure Analysis (FA). Faults in ICs increase proportionally with the growing number of transistors, narrower process margins and increasing complexity of IC design. The IC industry de...
| 第一著者: | |
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| フォーマット: | 学位論文 |
| 言語: | 英語 |
| 出版事項: |
2015
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| 主題: | |
| オンライン･アクセス: | http://eprints.usm.my/40968/ |
| Abstract | Abstract here |