Fault Diagnosis On Vlsi Adder Circuits Using Artificial Neural Network
Fault diagnosis on VLSI digital circuit is a technique to detect a fault and the location of the fault that present in a VLSI digital circuit. A faulty circuit in an IC can cause the IC to be malfunctioning and unusable. Therefore, the faulty circuit must be detected during the manufacturing process...
| 第一著者: | |
|---|---|
| フォーマット: | 学位論文 |
| 言語: | 英語 |
| 出版事項: |
2015
|
| 主題: | |
| オンライン･アクセス: | http://eprints.usm.my/40985/ |