Reduced Galloping Column Algorithm For Memory Testing

Memory testing is significantly important nowadays especially in SOC’s design, due to their rapid growth in the memory density and design complexity in smaller chip area and low power design. Thus, test time in memory testing is a key challenge to accelerate time to market, high yield and low test...

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Bibliographic Details
Main Author:	Ngieng , Siew Ching
Format:	Thesis
Language:	English
Published:	2015
Subjects:	TK7800-8360 Electronics
Online Access:	http://eprints.usm.my/41214/
Abstract	Abstract here

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