Hybrid Diagnosis Model To Determine Fault Isolation For Scan Chain Failure Analysis On 22nm Fabrication Process

With the rapid growth of Very Large Scale Integration (VLSI) in complex designs, there is high demand for Design for Testability (DFT). Vast study has proven that Scan based testing is achieving good test coverage with lower cost and smaller die area and is widely used in the industry. Scan chain fa...

Full description