Polycrystalline GaN Layer On M-Plane Sapphire Substrate For Metal-Semiconductor-Metal Photodetector

This thesis describes work on depositing polycrystalline gallium nitride (GaN) on m-plane sapphire substrate using cost effective physical deposition technique; electron beam (e-beam) evaporator and radio frequency (RF) sputtering, followed by annealing treatment in ammonia (NH3) ambient. The work w...

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Détails bibliographiques
Auteur principal: Kamarulzaman, Azharul Ariff
Format: Thèse
Langue:anglais
Publié: 2017
Sujets:
Accès en ligne:http://eprints.usm.my/42902/
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author Kamarulzaman, Azharul Ariff
author_facet Kamarulzaman, Azharul Ariff
author_sort Kamarulzaman, Azharul Ariff
description This thesis describes work on depositing polycrystalline gallium nitride (GaN) on m-plane sapphire substrate using cost effective physical deposition technique; electron beam (e-beam) evaporator and radio frequency (RF) sputtering, followed by annealing treatment in ammonia (NH3) ambient. The work was then extended to develop metal-semiconductor-metal (MSM) photodetector using the most possible metal/metal oxide contact, to increase the efficiency of the device. The initial part of this thesis focus on ameliorating the properties of the polycrystalline GaN layer by controlling gas ambient, time, temperature, and gas flow rate of the annealing treatment.
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spelling usm-429022019-04-12T05:24:53Z http://eprints.usm.my/42902/ Polycrystalline GaN Layer On M-Plane Sapphire Substrate For Metal-Semiconductor-Metal Photodetector Kamarulzaman, Azharul Ariff QC1 Physics (General) This thesis describes work on depositing polycrystalline gallium nitride (GaN) on m-plane sapphire substrate using cost effective physical deposition technique; electron beam (e-beam) evaporator and radio frequency (RF) sputtering, followed by annealing treatment in ammonia (NH3) ambient. The work was then extended to develop metal-semiconductor-metal (MSM) photodetector using the most possible metal/metal oxide contact, to increase the efficiency of the device. The initial part of this thesis focus on ameliorating the properties of the polycrystalline GaN layer by controlling gas ambient, time, temperature, and gas flow rate of the annealing treatment. 2017-12 Thesis NonPeerReviewed application/pdf en http://eprints.usm.my/42902/1/AZHARUL_ARIFF__KAMARULZAMAN.pdf Kamarulzaman, Azharul Ariff (2017) Polycrystalline GaN Layer On M-Plane Sapphire Substrate For Metal-Semiconductor-Metal Photodetector. PhD thesis, Universiti Sains Malaysia.
spellingShingle QC1 Physics (General)
Kamarulzaman, Azharul Ariff
Polycrystalline GaN Layer On M-Plane Sapphire Substrate For Metal-Semiconductor-Metal Photodetector
title Polycrystalline GaN Layer On M-Plane Sapphire Substrate For Metal-Semiconductor-Metal Photodetector
title_full Polycrystalline GaN Layer On M-Plane Sapphire Substrate For Metal-Semiconductor-Metal Photodetector
title_fullStr Polycrystalline GaN Layer On M-Plane Sapphire Substrate For Metal-Semiconductor-Metal Photodetector
title_full_unstemmed Polycrystalline GaN Layer On M-Plane Sapphire Substrate For Metal-Semiconductor-Metal Photodetector
title_short Polycrystalline GaN Layer On M-Plane Sapphire Substrate For Metal-Semiconductor-Metal Photodetector
title_sort polycrystalline gan layer on m plane sapphire substrate for metal semiconductor metal photodetector
topic QC1 Physics (General)
url http://eprints.usm.my/42902/
work_keys_str_mv AT kamarulzamanazharulariff polycrystallineganlayeronmplanesapphiresubstrateformetalsemiconductormetalphotodetector