Lee, S. C. (2011). Surface And Interface Phonon Polariton Characteristics Of Wurtzite ZnO-Based Semiconductor By Infrared Attenuated Total Reflection Spectroscopy.
Chicago Style (17th ed.) CitationLee, Sai Cheong. Surface And Interface Phonon Polariton Characteristics Of Wurtzite ZnO-Based Semiconductor By Infrared Attenuated Total Reflection Spectroscopy. 2011.
MLA引文Lee, Sai Cheong. Surface And Interface Phonon Polariton Characteristics Of Wurtzite ZnO-Based Semiconductor By Infrared Attenuated Total Reflection Spectroscopy. 2011.
警告：這些引文格式不一定是100％准確.