Structural And Optical Properties Of Sputtered Nanocrystalline Indium Nitride On Silicon Substrates

The aim of this project is to study the growth and characterization of nanocrystalline indium nitride (InN) on silicon (Si) substrates by means of various non-contact and non-destructive characterization tools. These include the scanning electron microscopy (SEM), energy dispersive X-ray (EDX)...

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Bibliographic Details
Main Author:	Amirhoseiny, Maryam
Format:	Thesis
Language:	English
Published:	2013
Subjects:	QC1 Physics (General)
Online Access:	http://eprints.usm.my/43801/
Abstract	Abstract here

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