Design And Characterization Of Silicon Nanowire Transistor And Logic Nanowire Inverter Circuits

The most important limitation in planer MOSFETs is current leakage between the source and the drain at the off-state (IOFF), which presents a critical problem in securing circuit reliability. To mitigate this problem, there are new types of transistors with a 3D structure, including silicon na...

पूर्ण विवरण

ग्रंथसूची विवरण
मुख्य लेखक:	Naif, Yasir Hashim
स्वरूप:	थीसिस
भाषा:	अंग्रेज़ी
प्रकाशित:	2013
विषय:	TK1-9971 Electrical engineering. Electronics. Nuclear engineering
ऑनलाइन पहुंच:	http://eprints.usm.my/45223/

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