Determination Of Fracture Toughness In PBGA Packages Using Finite Element And Experimental Methods

Electronic packages especially the plastic ball grid array (PBGA) has its unique crack failure arising from the soldering process. The existence of moisture absorbed in package from ambient condition causes vapor pressure. During reflow soldering processes (215°C), the moisture absorbed vaporizes...

全面介绍

书目详细资料
主要作者: Tan, Chew Pheng
格式: Thesis
语言:英语
出版: 2006
主题:
在线阅读:http://eprints.usm.my/56293/