Compact Modeling Of Deep Submicron CMOS Transistor With Shallow Trench Isolation Mechanical Stress Effect [TK7871.99.M44 T161 2008 f rb].
Thesis ini memperkenalkan satu model padat, dua model berasaskan empirikal dan satu model berasaskan fizikal untuk kesan tekanan mekanikal Pengasingan Peparit Cetek (STI) ke atas transistor CMOS di bawah submikron. This thesis introduces a compact model, two empirical-based models and a physi...
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| Format: | Thesis |
| Language: | English |
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2008
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| Online Access: | http://eprints.usm.my/9583/ |
| Abstract | Abstract here |
| _version_ | 1855629241037619200 |
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| author | Tan, Philip Beow Yew |
| author_facet | Tan, Philip Beow Yew |
| author_sort | Tan, Philip Beow Yew |
| description |
Thesis ini memperkenalkan satu model padat, dua model berasaskan empirikal dan satu model berasaskan fizikal untuk kesan tekanan mekanikal Pengasingan Peparit Cetek (STI) ke atas transistor CMOS di bawah submikron.
This thesis introduces a compact model, two empirical-based models and a physical-based model of Shallow Trench Isolation (STI) mechanical stress effect on deep submicron CMOS transistor.
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| first_indexed | 2025-10-17T07:54:17Z |
| format | Thesis |
| id | usm-9583 |
| institution | Universiti Sains Malaysia |
| language | English |
| last_indexed | 2025-10-17T07:54:17Z |
| publishDate | 2008 |
| record_format | EPrints |
| record_pdf | Restricted |
| spelling | usm-95832017-05-31T05:06:40Z http://eprints.usm.my/9583/ Compact Modeling Of Deep Submicron CMOS Transistor With Shallow Trench Isolation Mechanical Stress Effect [TK7871.99.M44 T161 2008 f rb]. Tan, Philip Beow Yew TK7800-8360 Electronics Thesis ini memperkenalkan satu model padat, dua model berasaskan empirikal dan satu model berasaskan fizikal untuk kesan tekanan mekanikal Pengasingan Peparit Cetek (STI) ke atas transistor CMOS di bawah submikron. This thesis introduces a compact model, two empirical-based models and a physical-based model of Shallow Trench Isolation (STI) mechanical stress effect on deep submicron CMOS transistor. 2008-08 Thesis NonPeerReviewed application/pdf en http://eprints.usm.my/9583/1/COMPACT_MODELING_OF_DEEP_SUBMICRON_CMOS_TRANSISTOR.pdf Tan, Philip Beow Yew (2008) Compact Modeling Of Deep Submicron CMOS Transistor With Shallow Trench Isolation Mechanical Stress Effect [TK7871.99.M44 T161 2008 f rb]. PhD thesis, Universiti Sains Malaysia. |
| spellingShingle | TK7800-8360 Electronics Tan, Philip Beow Yew Compact Modeling Of Deep Submicron CMOS Transistor With Shallow Trench Isolation Mechanical Stress Effect [TK7871.99.M44 T161 2008 f rb]. |
| thesis_level | PhD |
| title | Compact Modeling Of Deep Submicron CMOS Transistor With Shallow Trench Isolation Mechanical Stress Effect [TK7871.99.M44 T161 2008 f rb]. |
| title_full | Compact Modeling Of Deep Submicron CMOS Transistor With Shallow Trench Isolation Mechanical Stress Effect [TK7871.99.M44 T161 2008 f rb]. |
| title_fullStr | Compact Modeling Of Deep Submicron CMOS Transistor With Shallow Trench Isolation Mechanical Stress Effect [TK7871.99.M44 T161 2008 f rb]. |
| title_full_unstemmed | Compact Modeling Of Deep Submicron CMOS Transistor With Shallow Trench Isolation Mechanical Stress Effect [TK7871.99.M44 T161 2008 f rb]. |
| title_short | Compact Modeling Of Deep Submicron CMOS Transistor With Shallow Trench Isolation Mechanical Stress Effect [TK7871.99.M44 T161 2008 f rb]. |
| title_sort | compact modeling of deep submicron cmos transistor with shallow trench isolation mechanical stress effect tk7871 99 m44 t161 2008 f rb |
| topic | TK7800-8360 Electronics |
| url | http://eprints.usm.my/9583/ |
| work_keys_str_mv | AT tanphilipbeowyew compactmodelingofdeepsubmicroncmostransistorwithshallowtrenchisolationmechanicalstresseffecttk787199m44t1612008frb |