The micro-structural characterization of thermosonic cu-al intermetallic compounds and modelling of its interface stress
Thermosonic bonding of the Cu wire on Al bond pad is a common technology used in semiconductor industry. However, recent research show voids formation at this bonding interface on micro-chip, after an annealing treatment of High Temperature Storage (HTS). This voids formation is believed due to the...
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| Format: | Thesis |
| Language: | English English |
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2015
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| Online Access: | http://eprints.utem.edu.my/id/eprint/16883/ https://plh.utem.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=96181 |
| Abstract | Abstract here |