Fault Analysis And Test For Bridge Defect In Resistive Random Access Memory

Resistive Random-Access Memory (ReRAM) is one of the potential candidates of emerging semiconductor memory to replace the conventional memory technologies.Besides, ReRAM offers many attractive advantages, such as non-volatile, scalable, low power consumption, and fast data access. Due to the infancy...

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Bibliographic Details
Main Author:	Arshad, Norsuhaidah
Format:	Thesis
Language:	English English
Published:	2016
Subjects:	T Technology (General) TK Electrical engineering. Electronics Nuclear engineering
Online Access:	http://eprints.utem.edu.my/id/eprint/18373/ https://plh.utem.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=100175
Abstract	Abstract here

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