Electric field emissions of FPGA chip based on gigahertz transverse electromagnetic cell modeling and measurements
Modem integrated circuits (!Cs) are significant sources of undesired electromagnetic wave. Therefore, characterization of chip-level emission is essential to comply with EMC tests at the product level. A Gigahertz Transverse Electromagnetic (GTEM) cell is a common test instrument used to measure IC...
| 第一著者: | |
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| フォーマット: | 学位論文 |
| 言語: | 英語 英語 英語 |
| 出版事項: |
2016
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| オンライン･アクセス: | http://eprints.uthm.edu.my/10025/ |
| Abstract | Abstract here |