Afripin, M. A. A. (2020). Damage mechanics-based model for reliability assessment of through-silicon via interconnects.
Style de citation Chicago (17e éd.)Afripin, Mohammad Amirul Affiz. Damage Mechanics-based Model for Reliability Assessment of Through-silicon via Interconnects. 2020.
Style de citation MLA (9e éd.)Afripin, Mohammad Amirul Affiz. Damage Mechanics-based Model for Reliability Assessment of Through-silicon via Interconnects. 2020.
Attention : ces citations peuvent ne pas être correctes à 100%.