Afripin, M. A. A. (2020). Damage mechanics-based model for reliability assessment of through-silicon via interconnects.
Chicago Style (17th ed.) CitationAfripin, Mohammad Amirul Affiz. Damage Mechanics-based Model for Reliability Assessment of Through-silicon via Interconnects. 2020.
MLA (9th ed.) CitationAfripin, Mohammad Amirul Affiz. Damage Mechanics-based Model for Reliability Assessment of Through-silicon via Interconnects. 2020.
Warning: These citations may not always be 100% accurate.