Pattern recognition for manufacturing process variation using integrated statistical process control – artificial neural network

Variation in manufacturing process is known to be a major source of poor quality products and variation control is essential in quality improvement. In bivariate cases, which involve two correlated quality variables, the traditional statistical process control (SPC) charts are known to be effective...

詳細記述

書誌詳細
第一著者: Mohd Ariffin, Ahmad Azrizal
フォーマット: 学位論文
言語:英語
英語
英語
出版事項: 2015
主題:
オンライン・アクセス:http://eprints.uthm.edu.my/1279/
Abstract Abstract here

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