Integration of smed and triz in improving productivity at semiconductor industry
A case study on a test handler’s changeover process was conducted in a semiconductor organization (Intel Technology Sdn. Bhd.). The test handler being a constraint operation in the production supports the testing of two of the mainstream chipset products. Though the test handler is capable to suppor...
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| フォーマット: | 学位論文 |
| 言語: | 英語 |
| 出版事項: |
2011
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| 主題: | |
| オンライン･アクセス: | http://eprints.utm.my/29896/6/KartikSreedharaanKumaresanMFKM2011.pdf |