Integration of smed and triz in improving productivity at semiconductor industry

A case study on a test handler’s changeover process was conducted in a semiconductor organization (Intel Technology Sdn. Bhd.). The test handler being a constraint operation in the production supports the testing of two of the mainstream chipset products. Though the test handler is capable to suppor...

全面介绍

书目详细资料
主要作者: Kumaresan, Kartik Sreedharaan
格式: Thesis
语言:英语
出版: 2011
主题:
在线阅读:http://eprints.utm.my/29896/6/KartikSreedharaanKumaresanMFKM2011.pdf