Ong, H. Y. (2011). Functional test generation using micro operation fault model.
Chicago Style (17th ed.) CitationOng, Hui Yien. Functional Test Generation Using Micro Operation Fault Model. 2011.
MLA (9th ed.) CitationOng, Hui Yien. Functional Test Generation Using Micro Operation Fault Model. 2011.
Warning: These citations may not always be 100% accurate.