Ong, H. Y. (2011). Functional test generation using micro operation fault model.
Chicagoスタイル(17版)引用形式Ong, Hui Yien. Functional Test Generation Using Micro Operation Fault Model. 2011.
MLA(9版)引用形式Ong, Hui Yien. Functional Test Generation Using Micro Operation Fault Model. 2011.
警告: この引用は必ずしも正確ではありません.