APA引文

Ong, H. Y. (2011). Functional test generation using micro operation fault model.

Chicago Style (17th ed.) Citation

Ong, Hui Yien. Functional Test Generation Using Micro Operation Fault Model. 2011.

MLA引文

Ong, Hui Yien. Functional Test Generation Using Micro Operation Fault Model. 2011.

警告：這些引文格式不一定是100％准確.