Ong, H. Y. (2011). Functional test generation using micro operation fault model.
芝加哥风格引文Ong, Hui Yien. Functional Test Generation Using Micro Operation Fault Model. 2011.
MLA引文Ong, Hui Yien. Functional Test Generation Using Micro Operation Fault Model. 2011.
警告：这些引文格式不一定是100％准确.