Digital modelling test technique for mixed mode circuits

Recent demands in mobile communications, process control, automotive ASICs and smart sensors has accelerated the mixed-signal market and escalated the importance of mixed-signal test development. Mixed-signal circuit or mixed mode circuit is normally tested separately based on their core function. H...

書誌詳細
第一著者:	Leong, Mun Hon
フォーマット:	学位論文
言語:	英語
出版事項:	2005
主題:	TK Electrical engineering. Electronics Nuclear engineering
オンライン･アクセス:	http://eprints.utm.my/4215/1/LeongMunHonMFKE2005.pdf

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